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[Fsuk-manchester] smart read out
From: |
EVISON ROY |
Subject: |
[Fsuk-manchester] smart read out |
Date: |
Mon, 19 Mar 2012 01:56:19 +0000 |
Dear all,
not sure that this is the right place/protocol but
regarding last sat. Manlug meeting I was asking about the results of a
Gparded assessment of a hard drive that returned a result of several
1MG of unallocated space after an automated partitioning event under
Debian, post installation.
I did a Gparted Magick SMART test after wards, the results of which
I assessed to be that Debian had successfully avoided the bad blocks
but needed to remap on each boot; is this correct and is it likely to
continue to boot, also do you think the drive would survive another
install?
smartctl 5.41 2011-06-09 r3365 [i686-linux-3.2.0-pmagic] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Seagate Barracuda 7200.7 and 7200.7 Plus
Device Model: ST340014AS
Serial Number: 5MQ3YNH3
Firmware Version: 8.12
User Capacity: 40,000,000,000 bytes [40.0 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 6
ATA Standard is: ATA/ATAPI-6 T13 1410D revision 2
Local Time is: Sun Mar 18 18:51:22 2012 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 430) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off
support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 24) minutes.
SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE
UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 062 049 006 Pre-fail
Always - 230667822
3 Spin_Up_Time 0x0003 098 098 000 Pre-fail
Always - 0
4 Start_Stop_Count 0x0032 099 099 020 Old_age
Always - 1245
5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail
Always - 0
7 Seek_Error_Rate 0x000f 088 060 030 Pre-fail
Always - 751094217
9 Power_On_Hours 0x0032 088 088 000 Old_age
Always - 11301
10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail
Always - 0
12 Power_Cycle_Count 0x0032 099 099 020 Old_age
Always - 1261
194 Temperature_Celsius 0x0022 034 056 000 Old_age
Always - 34 (0 5 0 0)
195 Hardware_ECC_Recovered 0x001a 062 048 000 Old_age
Always - 230667822
197 Current_Pending_Sector 0x0012 100 100 000 Old_age
Always - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age
Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age
Always - 0
200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age
Offline - 0
202 Data_Address_Mark_Errs 0x0032 100 253 000 Old_age
Always - 0
SMART Error Log Version: 1
ATA Error Count: 2
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 2 occurred at disk power-on lifetime: 11025 hours (459 days + 9 hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 d7 00 00 e0 Error: UNC at LBA = 0x000000d7 = 215
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 d8 08 d7 00 00 e0 00 00:00:12.733 READ DMA
c8 d8 08 d7 00 00 e0 00 00:00:12.732 READ DMA
c8 d8 08 df 00 00 e0 00 00:00:12.732 READ DMA
c8 d8 08 cf 00 00 e0 00 00:00:12.730 READ DMA
c8 d8 08 c7 00 00 e0 00 00:00:12.730 READ DMA
Error 1 occurred at disk power-on lifetime: 11025 hours (459 days + 9 hours)
When the command that caused the error occurred, the device was
active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 d7 00 00 e0 Error: UNC at LBA = 0x000000d7 = 215
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 d8 08 d7 00 00 e0 00 00:00:12.733 READ DMA
c8 d8 08 df 00 00 e0 00 00:00:12.732 READ DMA
c8 d8 08 cf 00 00 e0 00 00:00:12.732 READ DMA
c8 d8 08 c7 00 00 e0 00 00:00:12.730 READ DMA
c8 d8 08 bf 00 00 e0 00 00:00:12.730 READ DMA
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining
LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 11301 -
# 2 Extended offline Completed without error 00% 11300 -
# 3 Short offline Completed without error 00% 11299 -
# 4 Short offline Completed without error 00% 11197 -
# 5 Short offline Completed without error 00% 1 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Many thanks if you reply, I am struggling
Roy.
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